The ability to display up to ten eye diagrams simultaneously provides a high-level view of system performance during system bring-up. The multi-measurement scenario analysis capability easily lends ...
SAN JOSE — In a move that could lower IC testing costs and accelerate cycle times, LogicVision Inc. here today announced the industry's fastest software and hardware solution for silicon debugging.
Teledyne LeCroy has introduced the DDR Debug Toolkit for complete physical layer analysis of DDR 2/3/4 and LPDDR2/3 signals. Most oscilloscope-based DDR physical layer test tools on the market are ...
Debug consumes more time than any other aspect of the chip design and verification process, and it adds uncertainty and risk to semiconductor development because there are always lingering questions ...
AUSTIN, Texas--(BUSINESS WIRE)--NIWeek – NI (Nasdaq: NATI), the provider of a software-defined platform that helps accelerate the development and performance of automated test and automated ...
Debug often has been labeled the curse of management and schedules. It is considered unpredictable and often can happen close to the end of the development cycle, or even after – leading to frantic ...
Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
CHESTNUT RIDGE, N.Y., Nov. 24, 2014 /PRNewswire/ -- Teledyne LeCroy today introduces the DDR Debug Toolkit for complete physical layer analysis of DDR 2/3/4 and LPDDR2/3 signals. Most ...
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