STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
With its 400-MHz bandwidth, the HVD3220 differential probe from Teledyne LeCroy permits in-circuit GaN and SiC system testing. The high-voltage probe carries a 1500-VDC CAT III rating, as well as a ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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