Electronic Design

How to Succeed With Structural Test

The decision to change from a functional to a structural test methodology is a far-reaching one. Functional test vectors are meant to check for correct device functionality. Structural test vectors ...
EDN

DFT Stirring UP ATE at ITC

BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...
Semiconductor Engineering

Integrating Design Verification To Approach Zero Defects

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
EDN

ATE startup Inovys rolls out desktop DFT tester

PLEASANTON, Calif.–In another move to lower the cost of IC test, Inovys Corp. here officially announced a desktop version of its IC tester line for use in design-for-test (DFT) chip applications.