Over the last twenty years, structural testing with scan chains has become pervasive in chip design methodology. Indeed, it’s remarkable to think that most electronic devices we interact with today ...

As chipmakers move towards finer geometries, IC designs are obviously becoming more complex and expensive. Given the enormous risks involved, chipmakers must ensure the quality of the parts before ...

BALTIMORE — Design-for-test (DFT) is no longer just a subject for debate and International Test Conference (ITC) papers as the automated test equipment (ATE) industry begins to respond with more than ...

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Of all the electronic design automation (EDA) tools on the market, design for test (DFT) may be the most under-appreciated; even though building testability into a chip during the design phase will ...

Printed-circuit-board test and inspection becomes challenging as component sizes shrink and access disappears. Solutions include design and DFT software; probes and fixtures; in-circuit, flying-probe, ...