Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The FilmTek™ 2000M TSV is a fully ...
A coating’s optical thickness is determined by white light interference and mathematical calculations are used to translate the pattern into optical thickness. In thin film metrology, these ...
UV, VIS & NIR Reflectometers & Spectroscopic Ellipsometers for semi-transparent thin film charcterisation; Optical Emission Spectroscopy (OES) systems; Plasma Monitoring & Process Control Systems The ...
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