This article is focused on introducing a control chart technique using relative standard deviation (RSD) statistics (i.e., RSD chart); in other words, a coefficient of variation chart for continued ...
Part two of this three-part series reveals control technology concepts to reduce process variability and increase profitability ...
In this, the fifth instalment of the "Let's Talk PVT Monitoring" series I chat with Oliver King about monitoring in-chip conditions in modern SoCs and this time we discuss process detection and ...
Revealing another piece of its DFM tool arsenal, Synopsys Inc. today detailed its new process-aware design-for-manufacturing (PA-DFM) tools, meant to analyze variability effects at the custom/analog ...
It is becoming more and more difficult in nanometer designs to reliably print the image intended by the designer. This task is demanding enough under normal conditions; maintaining pattern fidelity ...
A new methodology to assess the impact of fabrication inherent process variability on 14-nm fin field effect transistor (FinFET) device performance. August 18th, 2021 - By: Coventor A new methodology ...
SE: Especially with advanced nodes, there are many types of variation in the process and today’s design and verification tools have to understand this. How does variation impact the sphere of your ...
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