ATC 2.0 Option Enables Dynamic Multisite Sensing and Regulation of Device Temperature for Optimized Test of High-End Automotive SoCs TOKYO, Oct. 24, 2023 (GLOBE NEWSWIRE) -- Leading semiconductor test ...
The semiconductor market is evolving, with devices becoming more complex as chip designers add cores and pursue 2.5D and 3D integration strategies. This complexity presents challenges extending from ...
Understand your devices and materials at every level—from microscopic structure to system behavior. Our characterization capabilities include high-resolution imaging, mechanical testing, electrical ...
TOKYO, Dec. 10, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the M5241 Memory Handler, its next-generation handler developed ...
The past decade�s build-up of RF ATE for second-generation (2G) cellular transceivers now is testing more than two billion RF devices annually (Figure 1). Next-generation consumer wireless devices ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results