New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic force microscopy (AFM) is a technique originally developed to assess the physical and mechanical properties of materials at extremely high resolutions, but the imaging speeds aren't fast enough ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Researchers at Oak Ridge National Laboratory used specialized tools to study materials at the atomic scale and analyze ...

The research introduces a 3D approach to visualize electrical properties in perovskite films, paving the way for enhanced ...

Cecilia Van Cauwenberghe explains how to measure the future using nanoscale metrology and discusses the global competition ...