What Is Atomic Force Microscopy? Atomic force microscopy (AFM) is a powerful technique that enables surface ultrastructure visualization at molecular resolution. 1 Besides three-dimensional (3D) ...

A new microscopy technique allows scientists to see single-atom-thick boron nitride by making it glow under infrared light. Researchers from the Physical Chemistry and Theory departments at the Fritz ...

A fascinating material: Hexagonal boron nitride (hBN) is a very important material for the large and thriving field of two-dimensional (2D) materials research and emerging new devices. The challenge: ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

In recent years, fluorescence quenching microscopy (FQM) 1-3 has emerged as a viable technique that allows for the swift, cost-effective, and accurate imaging of two-dimensional (2D) materials like ...

New hybrid nano-microscope by KRISS allows simultaneous measurement of optical and electrical properties. Expected to accelerate nano-scale research on advanced equipment and materials such as bilayer ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

have found a new way to image layers of boron nitride that are only a single atom thick. This material is usually nearly invisible in optical microscopes because it has no optical resonances. To ...