Design-for-test (DFT) technology is a key complement to ATE systems. That's the conclusion arising from interviews conducted at Agilent Technologies' facility here, where the company develops and ...
Shipping high-quality ICs requires that design-for-test (DFT) methodologies be included in a design. DFT provides external access at the device’s I/O pins to internal registers to either control or ...
Sunnyvale, Calif.-based SynTest Technologies Inc. and San Jose-based Schlumberger Ltd.’s Saber business unit have formed an alliance. The two companies are collaborating to bridge the gap between ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...
Nanometer SOC device manufacturing requires flexible at-speed functional testing. The semiconductor industry gradually is transitioning to nanometer manufacturing processes. With this technology comes ...
SAN JOSE, Calif. — August 8, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced a successful collaboration with DA-Test ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback